Research

New AFM

Location: Room , IPST

 •Our new Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.

 •With the conductive AFM compatibility, the MFP-3D AFM is ideal for many applications.

 

Head and base:

Location: Room , IPST

 • Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts.

 • The NPS?sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements.

Controller:

Location: Room , IPST

 • 100% digital for low noise, fast operation, and flexibility

 • Field Programmable Gate Array (FPGA) and Digital Signal Processor (DSP)

 • Fast analog-to-digital/digital-to-analog conversions