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Lab Tour


Location: Room , IPST

  • Our new Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.
  • With the conductive AFM compatibility, the MFP-3D AFM is ideal for many applications.

Head and base:

Location: Room , IPST

  • Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts.
  • The NPS sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements.


Location: Room , IPST

  • 100% digital for low noise, fast operation, and flexibility
  • Field Programmable Gate Array (FPGA) and Digital Signal Processor (DSP)
  • Fast analog-to-digital/digital-to-analog conversions